TOP-TEK has a highly skilled staff of Test and Application experts dedicated to providing state of the art test solutions in our On-site Test Labs. We offer a full range of system test stations which enables us to test everything from low complexity EVM (Evaluation Modules) to high complexity systems to ensure high quality products.
Our On-site Test Labs utilize a variety of test stations that enable a wide array of application specific tests including the ability to do on board firmware programming. The best fitting test strategy is applied based on the board functionality. TOP-TEK owns and maintains the test equipment and will purchase custom test equipment per customer requirements. Our experts and technicians can minimize debugging at the customer site and help transition to the production environment.
Reliability test
For those products designed and developed by TOP-TEK, before sending them to third-party laboratories and agency for certification testing, besides considering some specific certification requirements at the initial design stage, we can also do some reliability tests in our factory, to ensure the successful certificated rate higher for the products we designed when doing third-party certification testing.
The main reliability equipment includes, drop test, high and low temperature impact test, salt spray test, vibration test, EMC test, aging test, button life test, etc.
ICT/FCT/ATE test
In order to ensure the quality of product welding, in addition to the online AOI, SPI, FAI, X-RAY, our factory also has the ability to develop and design automated test fixtures by ourselves. In other words, our factory has the PIE department, which can do design ATE hardware, structure and software; from the designed drawings to the real ATE fixtures which can be used to the product functional testing, all of these can be finished by TOP-TEK in house. We have the ability to customize ATE fixtures for customers. In order to improve efficiency, save time, and ensure that product quality and functions are qualified.
